基本信息
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Career Trajectory
Bio
Fred Bijkerk received the Ph.D. degree in experimental physics from the University of Amsterdam in 1993. From 2004 to 2014, he was the Department Head of the FOM-Institute for Plasma Physics Rijnhuizen. In 2005, he was appointed as a Professor on XUV sources and multilayer optics at the MESA+ Institute for Nanotechnology, University of Twente. He initiated the Industrial Focus Group XUV Optics, MESA+, a public-privately funded research initiative on application-inspired thin film systems and XUV optics. He received the FOM Valorization Prize in 2011. He has published over 250 journal articles and 35 patents on thin film systems and XUV optics.
Research Interests
Papers共 364 篇Author StatisticsCo-AuthorSimilar Experts
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SPIE eBooks (2023)
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Applied surface science (2023): 155765-155765
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Author Statistics
#Papers: 364
#Citation: 4838
H-Index: 33
G-Index: 43
Sociability: 7
Diversity: 3
Activity: 65
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