基本信息
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职业迁徙
个人简介
He is responsible for technology qualification and development of dielectric reliability methodologies. He authored and coauthored more than 100 technical and conference papers with several invited papers and tutorials, as well as 11 IEEE International Electron Device Meeting (IEDM) papers. His research interests include reliability physics, device physics, and carrier transport phenomena.,Dr. Wu has served on the Device Dielectric Committee as the Chair and a Cochair for the 2007 and the 2005 International Reliability Physics Symposium (IRPS), respectively. He is a member of the CMOS and Interconnect Reliability committee of IEDM for 1999 and 2000.
研究兴趣
论文共 169 篇作者统计合作学者相似作者
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IEEE International Reliability Physics Symposiumpp.1-9, (2024)
Kenji Okada, Kei Date, Brian McGowan,Huai Huang,Ernest Wu, Niki Fokas, Claire Silvestre, Lili Cheng, Atsunobu Isobayashi, Tatsuya Usami, Akihisa Iwasaki, Noboru Takeuchi, Hiroshi Miki, Yasuhiro Isobe,Miaomiao Wang, Craig Child
IEEE Transactions on Electron Devicesno. 99 (2024): 1-8
IEEE International Reliability Physics Symposiumpp.1-8, (2024)
IEEE International Reliability Physics Symposiumpp.2A.1-1-2A.1-6, (2024)
Advanced Electronic Materialsno. 10 (2023): n/a-n/a
Microelectronics Reliability (2023): 114982-114982
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
2023 IEEE International Reliability Physics Symposium (IRPS)pp.1-9, (2023)
2022 IEEE International Reliability Physics Symposium (IRPS) (2022)
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作者统计
#Papers: 160
#Citation: 4200
H-Index: 33
G-Index: 60
Sociability: 6
Diversity: 2
Activity: 10
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