Daewoong Kwon - Dept Elect Engn, Hanyang Univ

基本信息

浏览量：0

职业迁徙

个人简介

暂无内容

研究兴趣

论文共 115 篇作者统计合作学者相似作者

按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选

Optimal Data Distribution in FeFET-based Computing-in-memory Macros

Yonguk Sim,Choongseok Song,Eun Chan Park,Jongwook Jeon,Daewoong Kwon,Doo Seok Jeong

2024 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, ISCAS 2024 (2024)

引用0浏览0EIWOS引用

Robust 1/f Noise Unaffected by Program/Erase Cycling-Induced Damage in Ferroelectric Schottky Barrier FETs

Wonjun Shin,Ryun-Han Koo,Sangwoo Kim,Dongseok Kwon,Jae-Joon Kim,Daewoong Kwon,Jong-Ho Lee

IEEE ELECTRON DEVICE LETTERSno. 9 (2024): 1645-1648

引用0浏览0EIWOS引用

Effects of Deposition Power and Thermal Treatment on Ferroelectric Properties of Sputtered Hf $_\text{0.5}$ Zr $_\text{0.5}$ O $_\Text{2}$

Changhyeon Han,Ki Ryun Kwon,Jiyong Yim,Jeonghan Kim,Sangwoo Kim,Soi Jeong,Eun Chan Park,Ji Won You,Rino Choi,Daewoong Kwon

IEEE Transactions on Electron Devicesno. 99 (2024): 1-5

引用0浏览0EIWOS引用

Polarization Pruning: Reliability Enhancement of Hafnia-Based Ferroelectric Devices for Memory and Neuromorphic Computing

Ryun-Han Koo,Wonjun Shin,Jangsaeng Kim,Jiyong Yim,Jonghyun Ko,Gyuweon Jung,Jiseong Im,Sung-Ho Park,Jae-Joon Kim,Suraj S. Cheema,Daewoong Kwon,Jong-Ho Lee

ADVANCED SCIENCEno. 43 (2024)

引用0浏览0WOS引用

Examination of Ferroelectric Domain Dynamics in HZO under Endurance Cycling Stress

Ryun-Han Koo,Wonjun Shin,Sangwoo Ryu, Seungwhan Kim,Gyuweon Jung,Sung-Tae Lee,Jae-Joon Kim,Daewoong Kwon,Jong-Ho Lee

IEEE ELECTRON DEVICE LETTERSno. 6 (2024): 1016-1019

引用0浏览0EIWOS引用

Scaling Effects on Memory Characteristics of Ferroelectric Field-effect Transistors

Kitae Lee,Jiyong Yim,Wonjun Shin,Sihyun Kim,Daewoong Kwon

IEEE Electron Device Lettersno. 5 (2024): 805-808

引用0浏览0EIWOS引用

Suppression of Gate-Induced-Drain-Leakage Utilizing Local Polarization in Ferroelectric-Gate Field-Effect Transistors for DRAM Applications

Been Kwak,Kitae Lee,Sihyun Kim,Daewoong Kwon

IEEE Electron Device Lettersno. 5 (2024): 813-816

引用0浏览0EIWOS引用

High-density 3D-NAND Flash with Dual-String Select Line (D-SSL)

Been Kwak,Daewoong Kwon,Jang-Gn Yun

Engineering Research Express (2024)

引用0浏览0引用

Proposition of Adaptive Read Bias: A Solution to Overcome Power and Scaling Limitations in Ferroelectric‐Based Neuromorphic System

Ryun-Han Koo,Wonjun Shin, Seungwhan Kim,Jiseong Im,Sung-Ho Park, Jong Hyun Ko,Dongseok Kwon,Jae-Joon Kim,Daewoong Kwon,Jong-Ho Lee

ADVANCED SCIENCEno. 5 (2024)

引用0浏览0WOS引用

A New Back-End-Of-Line Ferroelectric Field-Effect Transistor Platform Via Laser Processing

Sang Woo Kim, Wonjun Shin,Ryun-Han Koo,Jangsaeng Kim,Jiseong Im, Dooyong Koh, Jong-Ho Lee,Suraj S. Cheema,Daewoong Kwon

SMALL (2024)

引用0浏览0WOS引用

加载更多

作者统计

合作学者

合作机构

D-Core

合作者
学生
导师

暂无相似学者，你可以通过学者研究领域进行搜索筛选

数据免责声明

页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果，我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问，可以通过电子邮件方式联系我们：report@aminer.cn