基本信息
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职业迁徙
个人简介
Chulsoon Chang received the M.S. degree in micro semiconductor engineering from Korea University, Seoul, South Korea, in 2001.
He joined Samsung Electronics, Hwaseong, South Korea, in 2001, where he has been involved in developing SRAM and dynamic random access memory (DRAM) process integration engineering. His current research interests include DRAM BEOL process integration.
研究兴趣
论文共 2 篇作者统计合作学者相似作者
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Daewoong Lee,Jaehyeok Baek,Hye-Jung Kwon,Dae-Hyun Kwon,Chulhee Cho, Sang-Hoon Kim, Donggun An,Chulsoon Chang,Unhak Lim,Jiyeon Im,Wonju Sung,Hye-Ran Kim, Sun-Young Park,Hyoung-Joo Kim,Hoseok Seol,Juhwan Kim,Jungbum Shin,Gil-Young Kang,Yong-Hun Kim,Sooyoung Kim,Wansoo Park,Seok-Jung Kim,Chan-Yong Lee,Seungseob Lee,Tae-Hoon Park,Chi-Sung Oh,Hyodong Ban,Hyungjong Ko,Hoyoung Song,Tae-Young Oh,Sang-Joon Hwang, Kyung-Suk Oh,Jung-Hwan Choi,Jooyoung Lee
Daewoong Lee,Hye-Jung Kwon,Daehyun Kwon,Jaehyeok Baek,Chulhee Cho,Sanghoon Kim,Donggun An,Chulsoon Chang,Unhak Lim,Jiyeon Im,Wonju Sung,Hye-Ran Kim, Sun-Young Park,HyoungJoo Kim,Ho-Seok Seol,Juhwan Kim,Junabum Shin,Kil-Youna Kang,Yong-Hun Kim,Sooyoung Kim,Wansoo Park,Seok-Jung Kim,ChanYong Lee,Seungseob Lee,TaeHoon Park,Chi Sung Oh,Hyodong Ban,Hyungjong Ko,Hoyoung Song,Tae-Young Oh,SangJoon Hwang,Kyung Suk Oh,Jung-Hwan Choi,JooYoung Lee
2022 IEEE International Solid- State Circuits Conference (ISSCC) (2022)
作者统计
#Papers: 2
#Citation: 13
H-Index: 2
G-Index: 2
Sociability: 4
Diversity: 0
Activity: 0
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