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个人简介
Emmanuel Chery received the M.S. degree from the Institut National des Sciences Appliquées, Rennes, France, in 2010, and the Ph.D. degree from the University of Grenoble, Grenoble, France, in 2014.
From 2011 to 2014, he was with STMicroelectronics, Crolles, France, working on the reliability of porous low-k dielectrics. In 2014, he joined the Technology and Quality Engineering Department, ams AG, Graz, Austria, where he was responsible for several CMOS process qualifications. Since 2019, he has been a Researcher on 3-D technologies reliability with the reliability group of imec, Leuven, Belgium.
研究兴趣
论文共 30 篇作者统计合作学者相似作者
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IEEE Transactions on Electron Devicesno. 99 (2024): 1-7
openalex(2024)
IEEE TRANSACTIONS ON ELECTRON DEVICESno. 6 (2024): 3845-3851
SOLID-STATE ELECTRONICS (2024): 108864
IEEE transactions on electron devices/IEEE transactions on electron devicesno. 6 (2024): 3845-3851
IEEE Transactions on Electron Devicespp.1-7, (2024)
2023 International Electron Devices Meeting (IEDM)pp.1-4, (2023)
IEEE transactions on device and materials reliabilityno. 4 (2023): 615-622
ECS Meeting Abstractsno. 17 (2023): 1188-1188
2023 IEEE 73RD ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTCpp.1080-1084, (2023)
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作者统计
#Papers: 29
#Citation: 201
H-Index: 7
G-Index: 14
Sociability: 4
Diversity: 0
Activity: 1
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