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论文共 8 篇作者统计合作学者相似作者

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The Influence of Selected Material and Transport Parameters on the Accuracy of Modeling Early Voltage in SiGe-Base HBT
C Capasso,J Schaeffer,E A Hebert,Philip J Tobin,D C Gilmer,Dina H Triyoso,M Ramon,S Kalpat,Eric Luckowski,W Taylor, Youjin Jeon,Olubunmi O Adetutu,Rama I Hegde,Richard D Noble,M Jahanbani,Asanga H Perera, B Smith,Nigel Cave,M Sureddin,S Chheda, Rajan Singh, R S Islam, Jaeho Chang, Armiya Sultan, S Crown,Venkat R Kolagunta,S Shah, M Celik,David Wu,K C Yu, Robert J Fox,Soochang Park, C F Simpson,D Eades, S Gonzales,Chris D Thomas,John L Sturtevant, D J Bonser, N D Benavides, M J Thompson,Vikas R Sheth, J Fretwell,S Kim, Narayanan C Ramani, Kim N Green,M Moosa, Paul R Besser,Yuri Solomentsev,Dorothy E Denning, Michael Friedemann, B R Baker, R K Chowdhury, S Ufmani,Kirk J Strozewski, Rachel Zoe Carter, John Reiss, Manuel Olivares,Bengchoon Ho,T Lii,T Sparks,Tab A Stephens,Martin Schaller,C Goldberg,Kurt H Junker, Derick J Wristers, J Alvis,Bradley M Melnick
mag（2006）
引用23浏览0引用
23
0
Interconnect mechanical reliability with low κ dielectric as final ILD
Goldberg, C.,Mercado, L.,Filipiak, S.,Crown, S.
Proceedings of the IEEE 2002 International Interconnect Technology Conference (Cat. No.02EX519)pp.209-211, (2002)
引用4浏览0EIWOS引用
4
0
Dual inlaid copper and fluorine-doped TEOS BEOL integration for a high-performance 0.18 mu m technology
M Angyal, A Anandakugan,B Boeck,G Braeckelmann, J Brown,C Capasso,R Carter,R Chowdhury, A Das,D Denning,S Filipiak, P Gilbert,C Goldberg, H Kawasaki,K McGuffin,J Mendonca, A Michel,M Moosa, R Nelson, A Nghiem,C Pettinato,D Rose,D Smith,T Sparks,T Stephens, J Sun,S Thrasher,S Veeraraghavan, H Zawaideh
MATERIALS RESEARCH SOCIETY CONFERENCE PROCEEDINGSpp.91-101, (2001)
引用0浏览0引用
0
0
作者统计

#Papers: 8

#Citation: 160

H-Index: 6

G-Index: 7

Sociability: 5

Diversity: 0

Activity: 0

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