Boyang Du received the Bachelor's degree from the Harbin Institute of Technology, Harbin, China, in 2010, and the MS degree from Politecnico di Torino, Turin, Italy, in 2012, where he is currently working toward the PhD degree at the Department of Control and Computer Engineering. His work mainly focused on fault-tolerant electronic design and testing, while his research interests include also FPGA system design, SoC, and fault injection and simulation techinques. He is a student member of the IEEE.