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Research Interests

Papers共 15 篇Author StatisticsCo-AuthorSimilar Experts

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High Resolution Scanning Transmission Electron Microscopy (S/TEM) Investigation of Common Defects in Scandium and Aluminum Alloyed Β-Ga2o3
Andrew R Balog,Leixin Miao,Saiphaneendra Bachu,Jani Jesenovec,Benjamin Dutton,John McCloy,Nasim Alem
Microscopy and microanalysis the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canadano. Supplement_1 (2023): 1779-1780
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Author Statistics

#Papers: 15

#Citation: 38

H-Index: 3

G-Index: 6

Sociability: 4

Diversity: 1

Activity: 12

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