Arndt Last - Institute of Microstructure Technology, Karlsruhe Institute of Technology

基本信息

浏览量：0

职业迁徙

个人简介

暂无内容

研究兴趣

论文共 25 篇作者统计合作学者相似作者

按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选

Stabilizing High Aspect Ratio X-Ray Gratings with Top Layer Resist Grid

Michael Richter,Thomas Beckenbach,Constantin Rauch,Stephan Schreiner,Marcus Zuber,Elias Hamann,Arndt Last, Martin Boerner, Jan Korvink,Pascal Meyer

JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3no. 1 (2024)

引用0浏览0引用

Direct Detection System for Full-Field Nanoscale X-ray Diffraction-Contrast Imaging

Elliot Kisiel,Ishwor Poudyal,Peter Kenesei, Mark Engbretson,Arndt Last,Rourav Basak,Ivan Zaluzhnyy,Uday Goteti,Robert Dynes,Antonino Miceli,Alex Frano,Zahir Islam

Optics expressno. 16 (2024): 27682-27689

引用0浏览0WOS引用

Parabolic Gratings Enhance the X-ray Sensitivity of Talbot Interferograms

Pouria Zangi,Katsumasa Ikematsu,Pascal Meyer,Hidekazu Takano,Yanlin Wu,Josephine Gutekunst, Martin Boerner,Arndt Last,Jan G. Korvink,Atsushi Momose

SCIENTIFIC REPORTSno. 1 (2023)

引用0浏览0WOSNATURE引用

Investigation on the Mechanical Interface Stability of Curved High Aspect Ratio X-Ray Gratings Made by Deep X-Ray Lithography

Michael Richter,Thomas Beckenbach,Heiner Daerr,Sven Prevrhal,Martin Boerner,Josephine Gutekunst,Pouria Zangi,Arndt Last,Jan G. Korvink,Pascal Meyer

Journal of Micro/Nanopatterning Materials and Metrology（2022）

引用2浏览0引用

Pump-probe Dark-field X-ray Microscopy

Ishwor Poudyal,Zhi Qiao,Arndt Last,Michael R. Armstrong,Zahir Islam

arXiv (Cornell University) (2022)

引用0浏览0引用

Staircase Array of Inclined Refractive Multi-Lenses for Large Field of View Pixel Super-Resolution Scanning Transmission Hard X-ray Microscopy

Talgat Mamyrbayev,Katsumasa Ikematsu,Hidekazu Takano,Yanlin Wu,Kenji Kimura,Patrick Doll,Arndt Last,Atsushi Momose,Pascal Meyer

Journal of Synchrotron Radiation（2021）

引用3浏览0WOS引用

Multi-Lens Array Full-Field X-ray Microscopy

Alexander Opolka,Dominik Mueller,Christian Fella,Andreas Balles,Juergen Mohr,Arndt Last

Applied sciences（2021）

引用1浏览0引用

A Large Field-of-view High-Resolution Hard X-Ray Microscope Using Polymer Optics

Zhi Qiao,Xianbo Shi,Peter Kenesei,Arndt Last,Lahsen Assoufid,Zahir Islam

Review of Scientific Instruments（2020）

引用4浏览0WOS引用

Development of an Array of Compound Refractive Lenses for Sub-Pixel Resolution, Large Field of View, and Time-Saving in Scanning Hard X-ray Microscopy

Talgat Mamyrbayev,Alexander Opolka,Alexey Ershov,Josephine Gutekunst,Pascal Meyer,Katsumasa Ikematsu,Atsushi Momose,Arndt Last

Applied Sciencesno. 12 (2020): 4132-4132

引用4浏览0引用

At-wavelength Optics Characterisation Via X-ray Speckle- and Grating-Based Unified Modulated Pattern Analysis

Marie-Christine Zdora,Irene Zanette,Tunhe Zhou,Frieder J. Koch,Jenny Romell,Simone Sala,Arndt Last,Yasuo Ohishi,Naohisa Hirao,Christoph Rau,Pierre Thibault

Optics express（2018）

引用13浏览0WOS引用

加载更多

作者统计

合作学者

合作机构

D-Core

合作者
学生
导师

暂无相似学者，你可以通过学者研究领域进行搜索筛选

数据免责声明

页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果，我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问，可以通过电子邮件方式联系我们：report@aminer.cn