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个人简介
Andreas Kerber (Senior Member, IEEE) was born in Schnann, Austria. He received the Diploma degree in physics from the University of Innsbruck, Austria, in 2001, and the Ph.D. degree (Hons.) in electrical engineering from TU-Darmstadt, Germany, in 2004. He worked as an Intern with Bell Laboratories, Lucent Technologies, Murray Hill, NJ, USA, from 1999 to 2000. From 2001 to 2003, he was the Infineon Technologies Assignee to International SEMATECH, IMEC, Leuven, Belgium. From 2004 to 2006, he was with the Reliability Methodology Department, Infineon Technologies, Munich, Germany. From 2006 to 2009, he was with AMD, Yorktown Heights, NY, USA, as a Principal Member of Technical Staff for GLOBALFOUNDRIES, Malta, NY, USA, from 2009 to 2018, and for Skorpios Technologies, Albuquerque, NM, USA, from 2018 to 2019. Much of his work is centered around front-end-of-line reliability research with focus on metal gate/high-k CMOS technologies. He has coauthored over 110 papers in journals and conferences.
研究兴趣
论文共 117 篇作者统计合作学者相似作者
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Andreas Kerber, Phil Kliza, Daniel Beckmeier, Abhimanyu Ravindranath, Luo Yuan, Yun Liu, Owen W. Jungroth
2023 37th Symposium on Microelectronics Technology and Devices (SBMicro)pp.1-5, (2023)
2023 IEEE International Integrated Reliability Workshop (IIRW)pp.1-6, (2023)
Souvik Mahapatra,Andreas Kerber, Christian Monzio Compagnoni, Randy Koval,Gaudenzio Meneghesso, David Sheridan,Stephen Ramey, Runsheng Wang, Jim Stathis,Kevin J. Chen,Ben Kaczer,Lucio Pancheri, Elyse Rosenbaum,Chandra Mouli,Hei Wong
IEEE Transactions on Electron Devicesno. 11 (2019): 4497-4503
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作者统计
#Papers: 118
#Citation: 3341
H-Index: 28
G-Index: 54
Sociability: 6
Diversity: 3
Activity: 2
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