基本信息
浏览量:8
职业迁徙
个人简介
暂无内容
研究兴趣
论文共 38 篇作者统计合作学者相似作者
按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选
时间
引用量
主题
期刊级别
合作者
合作机构
Kun Gao,Pedro Herrera,Vidya Ramanathan,Victoria Naipak, Meng Wang, Renan Milo, Tal Yaziv, Nir BenDavid,Chen Dror,Hao Mei,Weihua Li,Xindong Gao,
Proceedings of SPIE (2019)
Pedro Herrera,Kun Gao,Chen Dror,Eitan Hajaj, Alon Alexander Volfman, Raviv Yohanan,Vidya Ramanathan,Victoria Naipak, Renan Milo, Tal Yaziv, Nir BenDavid, Meng Wang,
Proceedings of SPIE (2019)
Xueli Hao,Fang Fang,Young Ki Kim,Juan-Manuel Gomez,Vidya Ramanathan,Christian Sparka,Pradeep Subrahmanyan, Dimitry Sanko, Stilian Ivanov Pandev, Sanjay Kapasi,Zhou Ren, Markus Mengel,
Fang Fang,Xiaoxiao Zhang,Alok Vaid, Stilian Ivanov Pandev, Dimitry Sanko,Vidya Ramanathan,Kartik Venkataraman,Ronny Haupt
Karsten Gutjahr,Dongsuk Park,Yue Zhou,Winston Cho, Ki Cheol Ahn, Patrick Snow, Richard McGowan,Tal Marciano,Vidya Ramanathan,Pedro Herrera, Tal Itzkovich, Janay Camp,
Lokesh Subramany,Woong Jae Chung, Karsten Gutjahr,Miguel Garciamedina,Christian Sparka,Lipkong Yap,Onur Demirer, Ramkumar Karurshanmugam,Brent Riggs,Vidya Ramanathan,John C Robinson, Bill Pierson
Stilian Pandev,Fang Fang,Y K Kim, Jamie Tsai,Alok Vaid,Lokesh Subramany, Dimitry Sanko,Vidya Ramanathan, R Zhou,Kartik Venkataraman,Ronny Haupt
Lokesh Subramany,Woong Jae Chung,Karsten Gutjhar,Miguel Garciamedina,Christian Sparka,Lipkong Yap,Onur Demirer, Ramkumar Karurshanmugam,Brent Riggs,Vidya Ramanathan,John C Robinson, Bill Pierson
Vidya Ramanathan,Lokesh Subramany, Tal Itzkovich,Karsten Gutjhar, Patrick W Snow,Chanseob Cho,Lipkong Yap
Young Ki Kim, Mark Yelverton, John Tristan,Joungchel Lee, Karsten Gutjahr, Ching-Hsiang Hsu, Hong Wei, Lester Wang, Chen Li,Lokesh Subramany,Woong Jae Chung, Jeong Soo Kim,
Metrology, Inspection, and Process Control for Microlithography XXVIII (2014): 549-557
加载更多
作者统计
合作学者
合作机构
D-Core
- 合作者
- 学生
- 导师
数据免责声明
页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果,我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问,可以通过电子邮件方式联系我们:report@aminer.cn