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Graham Jensen,Vidyasagar Anantha, Alexa Greer,Raghav Babulnath, Satya Kurada,Brad Austin,Shravan Matham, Alex Joseph Varghese
EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY XI (2020)
J. Demarest,B. Austin, J. Arjavac,M. Breton,M. Bergendahl, M. Biedrzycki, C. Boye,B. Cilingiroglu, J. Gaudiello, J. Hager,S. Matham,K. Nguyen,
International Symposium for Testing and Failure AnalysisISTFA 2019: Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis (2019)
Luciana Meli,Karen Petrillo,Anuja De Silva,John C. Arnold,Nelson Felix,Christopher F. Robinson,Benjamin D. Briggs,Shravan Matham,Yann Mignot,Jeffrey Shearer, Bassem Hamieh, Koichi Hontake,
Shravan Matham, Curtis Durfee, Brock Mendoza,Devendra K. Sadana,Stephen W. Bedell,John Gaudiello,Sean Teehan, HeungSoo Choi,Ankit Jain, Martin Plihal
J. Demarest,B. Austin, J. Arjavac,M. Breton,M. Bergendahl, M. Biedrzycki, C. Boye, J. Gaudiello, J. Hager,S. Matham,K. Nguyen, M. Persala,
International Symposium for Testing and Failure AnalysisISTFA 2018: Conference Proceedings from the 44th International Symposium for Testing and Failure Analysis (2018)
Shinichiro Kawakami,Luciana Meli,Karen Petrillo,Anuja De Silva,John Arnold,Nelson M. Felix,Chris Robinson,Benjamin Briggs,Yann Mignot, Jeffrey Shearer, Bassem Hamieh, Koichi Hontake,
Extreme Ultraviolet (EUV) Lithography IX (2018)
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