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Shi-Jie Wen received his Ph.D in Material Engineering from University of Bordeaux I in 1993. He joined Cisco Systems Inc., San Jose, CA in 2004, where he has been engaged in IC component technology reliability assurance. His main interest is in silicon technology reliability, such as SEU, WLR, and complex failure analysis, etc. He is a member of DFR, SEU core teams in Cisco. Before Cisco, he worked in Cypress Semiconductor where he was involved in the area of product reliability qualification with technology in 0.35u, 0.25u, 0.18u, 0.13u and 90 nm.
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论文共 18 篇作者统计合作学者相似作者
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Nicholas J. Pieper, M. Chun, Yoni Xiong, H. M. Dattilo, Jenna B. Kronenberg, Sanghyeon Baeg,Shi-Jie Wen, Rita Fung, D. Chan, C. Escobar, Bharat L. Bhuva
IEEE International Reliability Physics Symposiumpp.1-7, (2024)
Y. Xiong,A. Feeley, N. J. Pieper,D. R. Ball, B. Narasimham,J. Brockman, N. A. Dodds, S. A. Wender,S. -J. Wen,R. Fung,B. L. Bhuva
2022 IEEE International Reliability Physics Symposium (IRPS)pp.7C.3-1-7C.3-7, (2022)
Journal of Electronic Testingno. 6 (2014): 751-761
Journal of Electronic Testingno. 1 (2014): 149-154
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