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Patrik Schmuki, born in 1960 in Winterthur, Switzerland, studied physical chemistry at the University of Basel (M. Sc., 1988), and carried out his graduate studies “Semiconductive properties of passive films” at ETH-Zürich (Ph. D. degree in 1992). After an employment as Assistant at ETHZ (1992-1994) he worked at the Brookhaven National Laboratory, NY, USA, using synchrotron techniques for thin film studies (1994-95). From 1995-1997 he was guest scientist at the Institute for Microstructural Sciences of the National Research Council of Canada where his research focused on surface phenomena on Si and III-V semiconductors. In 1997 he was elected Maitre d´Enseignement et de Recherche (Associate Professor) for Microstructuring Materials at the Department of Materials Science of EPFL (Swiss Federal Institute of Technology at Lausanne). He joined the materials science faculty at the FAU in the fall 2000.
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ANGEWANDTE CHEMIE-INTERNATIONAL EDITIONno. 7 (2024): e202319255-e202319255
Journal of the American Chemical Societyno. 48 (2023): 26122-26132
ACS applied materials & interfacesno. 26 (2023): 31776-31786
ELECTROCHIMICA ACTA (2023): 142081-142081
Small (Weinheim an der Bergstrasse, Germany) (2023)
ENERGY TECHNOLOGYno. 7 (2023)
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