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个人简介
Ming Zhang (S'06–M'07) received the B.S. degree in physics from Peking University, Beijing, China, in 1999 and the M.S. and Ph.D. degrees in electrical engineering from the University of Illinois at Urbana-Champaign (UIUC), Urbana, in 2001 and 2006, respectively.
He is currently a Staff Computer-Aided Design (CAD) Engineer with Intel Corporation, Folsom, CA. From 1999 to 2001, he developed microelectromechanical systems for nanolithography applications at the Microelectronics Laboratory of UIUC. From 2004 to 2005, he interned at Intel Corporation and developed soft error resilient circuits and fault-tolerant architectures. His Ph.D. research work included a soft error rate analysis methodology and various classes of soft-error tolerant circuit design techniques. His current research interests include error-resilient and low-power circuits, variation and degradation-tolerant circuits and architectures, and circuit/architecture design for nanotechnology. He has published more than twenty technical papers and holds seven issued or pending U.S. patents. He serves on the program committees of several IEEE conferences and symposia.
Dr. Zhang was a recipient of the M. E. Van Valkenburg Research Award for demonstrated excellence in circuit and system research and the University Award for excellence in teaching an undergraduate-level circuit class.
研究兴趣
论文共 22 篇作者统计合作学者相似作者
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San Jose, CApp.788-793, (2009)
Design & Test of Computers, IEEEno. 2 (2008): 142-148
Cretepp.23-28, (2007)
Berkeley, CApp.277-286, (2007)
Experiment Science and Technology (2007)
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