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Gildas Leger received the Physics engineering degree from the Institut National des Sciences Appliquées (INSA), Rennes, France, in 1999, and the Ph.D. degree in microelectronics from the University of Seville, Seville, Spain, in 2007.
Since 2008, he has been a tenured Scientist with the Spanish National Science Council (CSIC), Microelectronics Institute of Seville (IMSE-CNM), University of Seville. His main research interests are focused on the design and test of AMS-RF circuits, with a particular emphasis on space applications (radiation-hardened design) and data converters.
Dr. Leger has repeatedly served as a member of the program committee for several important conferences in the field of test, such as the Design, Automation, and Test in Europe (DATE) Conference or the IEEE European Test Symposium (ETS). He was the Analog Topic Chair of ETS from 2016 to 2018 and the General Chair and the Program Chair of the IEEE International Mixed-Signal Test Workshop (IMSTW) in 2017 and 2015, respectively.
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论文共 82 篇作者统计合作学者相似作者
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IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMSno. 12 (2023): 1918-1930
ELECTRONICSno. 22 (2023): 4559-4559
Zenodo (CERN European Organization for Nuclear Research) (2023)
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IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUESno. 99 (2023): 1-19
2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)pp.1-4, (2022)
William R. Eisenstadt, Mark Roos, Devin Morris,José Luis González-Jiménez, Christopery Mounet,Manuel J. Barragan,Gildas Leger,Florent Cilici,Estelle Lauga-Larroze,Salvador Mir,Sylvain Bourdel,M. Margalef-Rovira,
2022 IEEE EUROPEAN TEST SYMPOSIUM (ETS 2022) (2022)
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