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个人简介
Aman Aflaki received the M.S.E.E. degree in electrical engineering
from the Missouri University of Science and Technology, Rolla, MO, USA.
He is currently the Manager of Transceiver Test Group with Altera Corporation, San Jose, CA, USA, where he is
responsible for transceiver DFT, test development, hardware design and signal integrity for next generation FPGAs. He
has published papers in IEEE Transactions on Instrumentation and Measurement, ECTC, and DesignCon, and holds
two patents in the field of signal integrity for wafer sort testing.
研究兴趣
论文共 6 篇作者统计合作学者相似作者
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Yoon Changwook,Tsiklauri Mikheil, Zvonkin Mikhail,Fan Jun, L Drewniak James,Razmadze Alexander,Aflaki Aman,Kim Jingook, Chen Qinghua Bill
international symposium on electromagnetic compatibilitypp.654-659, (2014)
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Yujeong Shim,Dan Oh,Chuan Thim Khor,Bipin Dhavale, Swarup Chandra, Derek Chow, Weichi Ding,Kundan Chand,Aman Aflaki, Mayra Sarmiento
Hong Shi, Sergey Shumarayev, Weichi Ding,Xiaohong Jiang, Zhe Li, Tim Hoang, Shufang Tian,Aman Aflaki, Ken Daxer
semanticscholar(2011)
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