Snapshot Multi Angle Mueller Matrix Metrology Using Multiple Self-Interference

Garam Choi,Jinyong Kim,Jinseob Kim, Young-Uk Jin, Soonhong Hwang, Eunjoo Lee, Jaemin Ha, Wookrae Kim, Myungjun Lee

2024 Conference on Lasers and Electro-Optics (CLEO)（2024）

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Mueller Matrix,Recent Challenges,Optical Tomography,Massive Data,Azimuth Angle,Polarization Information

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