Direct Measurement of 2DEG States in Shallow Si:Sb Δ-Layers
Frode S. Strand,Simon P. Cooil, Quinn T. Campbell, John J. Flounders,Håkon I. Røst, Anna Cecilie Åsland, Alv Johan Skarpeid, Marte P. Stalsberg, Jinbang Hu, Johannes Bakkelund, Victoria Bjelland, Alexei B. Preobrajenski,Zheshen Li,Marco Bianchi,Jill A. Miwa,Justin W. Wells arxiv（2024）
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