Charge Trapping Gate Stack Enabled Non-Recessed Normally off AlGaN/GaN HEMT with High Threshold Voltage Stability

Kangyao Wen,Jiaqi He,Yang Jiang,Fangzhou Du,Chenkai Deng,Peiran Wang,Chuying Tang, Wenmao Li,Qiaoyu Hu, Yuhan Sun,Qing Wang,Yulong Jiang,Hongyu Yu

Applied Physics Letters（2024）

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