Design Optimization of Stacked-NMOS ESD Protection for Mixed-Voltage Application

Kyongjin Hwang, Ting Yang, Jie Zeng, Ajay, Guowei Zhang,Tupei Chen

2024 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)（2024）

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Key words

Stacked-NMOS,ESD,electric field,current uniformly,deep current distribution

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