Enhanced Endurance and Stability of FDSOI Ferroelectric FETs at Cryogenic Temperatures for Advanced Memory Applications
IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）
关键词
Silicon-on-insulator,FeFETs,Cryogenics,Logic gates,Iron,Frequency measurement,Thermal stability,Cryogenic,fully depleted silicon-on-insulator (FDSOI),ferroelectric (FE),multilevel cell
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