Wafer-Scale Photonic Parameter Extraction

Jordan N. Butt,Nathan F. Tyndall,Marcel W. Pruessner,Benjamin L. Miller,Nicholas M. Fahrenkopf,Alin O. Antohe,Todd H. Stievater

2024 Conference on Lasers and Electro-Optics (CLEO)（2024）

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关键词

Maximum And Minimum,Refractive Index,Silicon Nitride,Tunable Laser,Ellipsometry,Photonic Integrated Circuits,White Light Source,Department Of Commerce,Silicon Photonics,Waveguide Width,Core Thickness,Photonic Components,Core Refractive Index,Maximum Interference

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