A Novel Radiation-Hardened Level Shifter with Dv/dt Noise Immunity for 600V HVIC
IEEE TRANSACTIONS ON NUCLEAR SCIENCE（2024）
关键词
Noise,Threshold voltage,Logic gates,Flip-flops,Radiation hardening (electronics),Resistors,Leakage currents,High-voltage gate drive integrated circuit (HVIC),level shifter (LS),noise immunity,radiation hardened,total-ionizing-dose (TID) irradiation
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