Initiation and Arrest of Cracks from Corners in Multi-Chip Semiconductor Devices

Guodong Nian, Yu-Sheng Lin, Jia-Ming Yang,Sammy Hassan,Jyun-Lin Wu, Sherwin Tang,Jun He,Joost J. Vlassak,Zhigang Suo

JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS（2024）

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Key words
Crack initiation,Crack arrest,Corner,Interfacial toughness,Semiconductor devices
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