A Pixel-Wise Segmentation Method for Automatic X-ray Image Detection of Chip Packaging Defects
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY（2024）
Key words
X-ray imaging,Image segmentation,Packaging,Inspection,Feature extraction,Defect detection,Object segmentation,Attention gate (AG),chip packaging defect,defect segmentation,lightweight convolution,X-ray
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