Correlation Between Conducted Injection and Near-Field Scan Immunity in the L-Band

Near-Field Scan Immunity (NFSI) is a recent method for analyzing the electromagnetic (EM) susceptibility of an integrated circuit (IC), allowing the study of a system behavior subject to an intentional electromagnetic interference (IEMI). It is a non-intrusive technique that can precisely target component pins that are otherwise inaccessible. This paper compares NFSI to a conducted injection method inspired by the direct power injection (DPI) standard and presents a correlation between the two injection techniques between 500 MHz and 2 GHz. The numerical and experimental validation with different types of near-field probes is validated on passive linear loads.