Structural Changes in Ge1-xSnx and Si1-x-yGeySnx Thin Films on SOI Substrates Treated by Pulse Laser AnnealingO. Steuer,D. Schwarz,M. Oehme, F. Baerwolf, Y. Cheng,F. Ganss,R. Huebner,R. Heller,S. Zhou,M. Helm,G. Cuniberti,Y. M. Georgiev,S. PrucnalJOURNAL OF APPLIED PHYSICS（2024）引用 0|浏览31暂无评分AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
