Asymmetric Early Leakage Failure in Bi-Directional SCR ESD Protection Device in BCD Technology
IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）
关键词
Bi-directional silicon-controlled rectifier (Bi-SCR),bipolar junction transistor (BJT),bipolar-CMOS-DMOS (BCD),electrostatic discharge (ESD),on-chip ESD protection,PNP,technology computer-aided design (TCAD),transmission line pulse (TLP),vertical parasitic
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