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Total-Ionizing Dose Damage from X-Ray PCB Inspection Systems

N. J. Pieper, M. Chun,Y. Xiong, H. M. Dattilo,J. Kronenberg,S. Baeg,S. -J. Wen,R. Fung, D. Chan, C. Escobar,B. L. Bhuva

2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024（2024）

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Key words
X-rays,TID,Ring Oscillator,DRAM
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