Deep neural network-based lifetime diagnosis algorithm with electrical capacitor accelerated life test

Seok-Hoon Jeong,Jong-Whi Park,Hak-Sung Kim

JOURNAL OF POWER SOURCES(2024)

Cited 0|Views9
No score
Abstract
Power storage and conversion technologies are increasingly in demand for their energy efficiency and ecofriendliness, with capacitors being key in stabilizing and filtering voltage in these devices. However, during this process, thermal degradation phenomena often occur due to over -voltage and over -current. This degradation can lead to decreased performance, capacitor failure, and in severe cases, explosions. Thus, the precise monitoring and prediction of capacitor lifetime is paramount. In this study, we use accelerated life test data to create images using reference plots and compare the accuracy of deep neural network training through image fusion. This introduces a new methodology for monitoring the lifetime of capacitors. This approach involves collecting aging data through accelerated life tests and then generating images from time -series data composed of capacitor voltage, current, and resistance. These images are used to train the deep learning algorithm, extracting relevant features and predicting the remaining life of the capacitors. Our method demonstrates remarkable effectiveness, showing an impressive accuracy rate of 80% in the real-time monitoring of capacitors under various operating conditions. Ultimately, this deep neural network -based lifetime monitoring algorithm holds potential to be scaled and applied to diverse electronic systems, enhancing their reliability and safety.
More
Translated text
Key words
Accelerated degradation tests,Capacitor,Deep learning,Power conversion system
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined