Study on the Single-Event Burnout Mechanism of P-Gan Gate AlGaN/GaN HEMTs

Xiaohu Wang,Xuefeng Zheng,Danmei Lin,Hao Zhang,Yanrong Cao,Ling Lv,Yingzhe Wang,Peipei Hu,Jie Liu,Xiaohua Ma,Yue Hao

APPLIED PHYSICS LETTERS（2024）

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关键词

AlGaN/GaN HEMTs,Single Event Upsets,GaN

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