From Micro to Nano: Correlative Characterization of 3d Loess Microstructure Using Μxct and Fib-SemBo Yu,Tom Dijkstra,Wen Fan,Ian Smalley,Ya-ni Wei,Longsheng Dengcrossref(2024)引用 0|浏览4暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要