A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress

Emilija Zivanovic, Sandra Veljkovic,Nikola Mitrovic,Igor Jovanovic,Snezana Djoric-Veljkovic,Albena Paskaleva,Dencho Spassov,Danijel Dankovic

MICROMACHINES（2024）

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关键词
VDMOS,reliability,NBTI,responsible mechanisms,self-heating
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