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Highly Reliable Nanoelectrothermal Non-Volatile Memory with CMOS-level Voltage and Low On-State Resistance

Yong-Bok Lee,Pan-Kyu Choi, Min-Ho Gang, Su-Hyun Kim, Seung-Jun Lee,Tae-Soo Kim,So-Young Lee,Jun-Bo Yoon

2024 IEEE 37TH INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, MEMS(2024)

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Key words
Nanoelectromechanical (NEM) non-volatile memory,High reliability,Complementary metal-oxide-semiconductor (CMOS)-level voltage,Low contact resistance
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