Memcapacitor Crossbar Array with Charge Trapping Layer for Physical Unclonable Function in NAND Flash Architecture
2023 International Electron Devices Meeting (IEDM)（2023）
关键词
Crossbar Array,Physical Unclonable Functions,NAND Flash,Operation Mode,Matrix Multiplication,Differences In Response,3D Structure,Multilayer Perceptron,Bit Error Rate,Semiconductor Parameter Analyzer,Read Operation,3D Configuration,3D Array,Device Variation,Hamming Weight,Word Line
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要