A Holistic Methodology Toward Large-scale AI Implementation Using Realistic ReRAM Based ACiM from Cell to Architecture

S. Park,J. Kim,W. Koo, Y. Kwon,D. Suh,S. Lee,K. Kim,E. Han, J. Lee,Y. Lim,Y. Ahn, E. Park, S. Ryu,S. Kim,N. Park, H. Em, S. Kang,J. Cheon, E. Kim, J. Yi, T. Kim, M. Na,S. Cha

2023 International Electron Devices Meeting (IEDM)（2023）

引用 0|浏览16

暂无评分

关键词

Holistic Methodology,Holistic Approach,Voltage Drop,Weight Variation,Inference Accuracy,Non-volatile Memory,Pulse Width,Ideal Value,Cell Technologies,Output Current,Buffer Layer,Conductance States,Number Of Biases,Relaxivity Values,Ideal Output,Back-end-of-line

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要