A Holistic Methodology Toward Large-scale AI Implementation Using Realistic ReRAM Based ACiM from Cell to Architecture

S. Park,J. Kim,W. Koo, Y. Kwon,D. Suh,S. Lee,K. Kim,E. Han, J. Lee,Y. Lim,Y. Ahn, E. Park, S. Ryu,S. Kim,N. Park, H. Em, S. Kang,J. Cheon, E. Kim, J. Yi, T. Kim, M. Na,S. Cha

2023 International Electron Devices Meeting (IEDM)（2023）

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Key words

Holistic Methodology,Holistic Approach,Voltage Drop,Weight Variation,Inference Accuracy,Non-volatile Memory,Pulse Width,Ideal Value,Cell Technologies,Output Current,Buffer Layer,Conductance States,Number Of Biases,Relaxivity Values,Ideal Output,Back-end-of-line

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