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Controlling $t_c$ of Iridium Films Using Interfacial Proximity Effects

R. Hennings‐Yeomans, C.L. Chang, James Ding,A. Drobizhev,B. K. Fujikawa, Susan S. Han,G. Karapetrov,Yu. G. Kolomensky,V. Novosad,T. O’Donnell,J. L. Ouellet,John Pearson,Tomas Polakovic, Daniela Reggio,Benjamin Schmidt,B. Sheff,R. J. Smith, G. Wang,B. Welliver,V. Yefremenko

OSTI OAI (US Department of Energy Office of Scientific and Technical Information)（2018）

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