Forming-Free Selectors Based on Te in an Insulating SiOx Matrix
IEEE TRANSACTIONS ON ELECTRON DEVICES（2024）
关键词
Amorphous chalcogenide,endurance,leakage current,selectors,thermal stability,threshold voltage,threshold voltage drift
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要