Characterizing and Correcting Electron and Hole Trapping in Germanium Cross-Strip Detectors

We present measurements of electron and hole trapping in three COSI germanium cross-strip detectors. By characterizing the relative charge collection efficiency (CCE) as a function of interaction depth, we show that intrinsic trapping of both electrons and holes have significant effects on the spectroscopic performance of the detectors. We find that both the electron and hole trapping vary from detector to detector, demonstrating the need for empirical trapping measurements and corrections. Using our measurements of charge trapping, we develop a continuous depth-dependent second-order energy correction procedure. We show that applying this empirical trapping correction produces significant improvements to spectral resolution and to the accuracy of the energy reconstruction.