Digital Pixel Test Structures Implemented in a 65 Nm CMOS Process
Gianluca Aglieri Rinella,Anton Andronic,Matias Antonelli,Mauro Aresti,Roberto Baccomi,Pascal Becht,Stefania Beole,Justus Braach,Matthew Daniel Buckland,Eric Buschmann,Paolo Camerini,Francesca Carnesecchi,Leonardo Cecconi,Edoardo Charbon,Giacomo Contin,Dominik Dannheim,Joao de Melo,Wenjing Deng, Antonello di Mauro,Jan Hasenbichler,Hartmut Hillemanns,Geun Hee Hong,Artem Isakov,Antoine Junique,Alex Kluge,Artem Kotliarov,Filip Krizek,Lukas Lautner,Magnus Mager,Davide Marras,Paolo Martinengo,Silvia Masciocchi,Marius Wilm Menzel,Magdalena Munker,Francesco Piro,Alexandre Rachevski,Karoliina Rebane,Felix Reidt,Roberto Russo,Isabella Sanna,Valerio Sarritzu,Serhiy Senyukov,Walter Snoeys,Jory Sonneveld,Miljenko Suljic,Peter Svihra,Nicolas Tiltmann,Gianluca Usai, Jacob Bastiaan Van Beelen,Mirella Dimitrova Vassilev,Caterina Vernieri,Anna Villani Nuclear Instruments and Methods in Physics Research Section A Accelerators, Spectrometers, Detectors and Associated Equipment（2023）
Key words
Monolithic active pixel sensors,Solid state detectors
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