Nonintrusive Machine Learning-Based Yield Recovery and Performance Recentering for Mm-Wave Power Amplifiers: A Two-Stage Class-A Power Amplifier Case Study
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES（2024）
Key words
Calibration,Tuning,Monitoring,Radio frequency,Fabrication,System-on-chip,Prediction algorithms,Machine learning-based calibration,machine learning-based test,millimeter-wave (mm-wave) integrated circuits (ICs),power amplifiers (PAs),yield enhancement
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