Damage Properties of a Limiter-Protected LNA Caused by High-Power Microwave Pulses
IEEE TRANSACTIONS ON PLASMA SCIENCE（2023）
Key words
Pins,Heterojunction bipolar transistors,Radiation effects,Receiving antennas,Radio frequency,Microwave filters,Microwave circuits,Damage effect,heterojunction bipolar transistor (HBT),high-power microwave (HPM),PIN limiter
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined