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Investigation of Off-state Stress Time-Dependent Dynamic On-resistance of Commercial High Voltage GaN HEMTs

Yao Li, Hui Tang, Ke Zhang,Yiqiang Ni,Liang He,Zhiyuan He,Yijun Shi,Jun Liu

2023 IEEE 18th Conference on Industrial Electronics and Applications (ICIEA)(2023)

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关键词
GaN HEMTs,dynamic on-resistance,off-state stress time
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