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Learning and Controlling Silicon Dopant Transitions in Graphene Using Scanning Transmission Electron Microscopy

Max Schwarzer,Jesse Farebrother,Joshua Greaves,Ekin Dogus Cubuk,Rishabh Agarwal,Aaron Courville,Marc G. Bellemare,Sergei Kalinin,Igor Mordatch,Pablo Samuel Castro,Kevin M. Roccapriore

arXiv (Cornell University)（2023）

Cited 0|Views75
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Key words
Scanning Electron Microscopy,Environmental Scanning Electron Microscopy,Electron Tomography,Beam-Induced Motion Correction,Single-Particle Analysis
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