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Highly Efficient Layered Syndrome-based Double Error Correction Utilizing Current Summing in RRAM Cells to Simplify Decoder.

Shruti Dutta, Sai Charan Rachamadugu Chinni,Abhishek Das,Nur A. Touba

DFT(2023)

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关键词
Error Correcting Codes(ECC),Double Error Correcting codes (DEC),resistive RAM (RRAM),Orthogonal Latin Square (OLS),syndromes,soft errors
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