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High Sensing Margin Sensing Amplifier with Improved Reliability for STT-MRAM

Jiawei Fu, Lanyang Sun,Xinfang Tong,Bo Liu,Hao Cai

2023 IEEE 23RD INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY, NANO(2023)

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CMOS design kit,CMOS process,energy efficient applications,high sensing margin sensing amplifier,HSM-SA,spin-transfer-torque magnetoresistive random access memory,STT-MRAM
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