Heavy-ion and Proton Evaluation of AMD 7nm Versal? Multicore Scalar Processing System (PS)

2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC)(2023)

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摘要
This paper presents the single event response of AMD/XILINX 7nm Versal ACAP dual R5 and dual A72 ARM core processor system (PS) for space applications. The PS was evaluated using Xilinx's System Validation Tool (SVT) design suite. An accelerated particle beam experiment of an XCVC1902 device was performed using the heavy-ion source at Berkeley BASE and proton sources at Crocker Nuclear Laboratory (CNL) and TRIUMF. More than 10 million designs exercising all the PS power domains were generated during the test. The PS single-event results are presented and categorized in terms of detectability and correctability. No SEL was observed in the PS up to a LET of 80 MeV-cm(2)/mg, 110 degrees C, and VCCmax operating values. With all PS safety mechanisms enabled, beam test results show that the overall PS SEFI rate in GEO is 0.16 SEFI per year and 1 SEFI per year (at 500km and 51.6 degrees inclination) in LEO. Also, no uncorrectable events were observed in the PS caches and RAMs.
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关键词
SEU,SEFI,PS,FinFET,Versal,ACAP,Heavy-ions,Space
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