Initial Experience with an Electron FLASH Research Extension (FLEX) for the Clinac System

Kyuhak Oh,Kyle J. Gallagher,Megan Hyun,Diane Schott,Sarah Wisnoskie,Yu Lei,Samuel Hendley,Jeffrey Wong,Shuo Wang,Brendan Graff,Christopher Jenkins,Frank Rutar, Md Ahmed, Joshua Mcneur,Jeffrey Taylor, Marty Schmidt,Lasitha Senadheera,Wendy Smith,Donald Umstadter,Subodh M. Lele,Ran Dai, Dong Jianghu (James),Ying Yan,Zhou Su-min

JOURNAL OF APPLIED CLINICAL MEDICAL PHYSICS（2024）

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Key words

cell viability,conventional dose rate (CONV),dosimetry,electron Ultra-high dose rate (eFLASH),FLASH Research Extension (FLEX),linear accelerator,stress-activated senescence

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