Radiation Hardness of MALTA2 Monolithic CMOS Imaging Sensors on Czochralski Substrates
Milou van Rijnbach,Dumitru Vlad Berlea,Valerio Dao,Martin Gaži,Phil Allport,Ignacio Asensi Tortajada,Prafulla Behera,Daniela Bortoletto,Craig Buttar,Florian Dachs,Ganapati Dash,Dominik Dobrijević,Lucian Fasselt,Leyre Flores Sanz de Acedo,Andrea Gabrielli,Laura Gonella,Vicente González,Giuliano Gustavino, Pranati Jana, Long Li,Heinz Pernegger,Francesco Piro,Petra Riedler,Heidi Sandaker,Carlos Solans Sánchez,Walter Snoeys,Tomislav Suligoj,Marcos Vázquez Núñez, Anusree Vijay,Julian Weick,Steven Worm,Abdelhak M. Zoubir EUROPEAN PHYSICAL JOURNAL C（2024）
Key words
Radiation Hardness,CMOS Scaling,Double-Gate Transistors
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